WQF-510/520 FT-IR Spektrometer

WQF-510/520 FT-IR SpectrometerFeatures:1 High Stability:1.1 Unique cube-corner Michelson interferometer features not only small size and compact structure but also higher stability and less sensitive to vibrations and thermal variations compared with conventional Michelson interferometer.1.2 Outside IR source design with easy replacement provides higher thermal stability. Stable interference is obtained without the need of dynamic adjustment.1.3 High intensity IR source adopts a reflex sphere to obtain even and stable IR radiation.2 High Accuracy and Reliability:2.1 The application of programmable gain amplifier, high accuracy A/D converter and embedded computer improves the accuracy and reliability of the whole system.2.2 Fully sealed damp and dust-proof interferometer, adopting high performance, long lifetime sealing material and desiccator, ensures higher adaptability to the environment and increases accuracy and reliability in operation2.3 High accuracy gold coated optics with less energy losses realize maximum energy efficiency and increase energy output.3 Practical Analytical Software:3.1 Compatible PC control with user friendly, rich function software enables easy, convenient and flexible operation. Spectrum collect, spectrum conversion, spectrum collect, spectrum conversion, spectrum processing, spectrum analyzing, and spectrum output function etc. can be performed3.2 The spectrometer connects to PC via a USB port for automatic control and data communication, fully realizing plug-and-play and raising the software flexibility3.3 An optional external beam allows access to the widest variety of high sensitive peripheral sampling system, such as GC/IR interface and FTIR microscope.3.4 Various special IR libraries are available for routine search. Users can also add and maintain the libraries or set up new libraries by themselves4 Various Accessories:4.1 The sampling compartment is wide enough for various accessories such as diffused/specular reflection, ATR, Liquid cell, Gas cell, and IR microscope etc.4.2 PC controls the switch over between internal andexternal light beams to enable the use of special IR accessories such as external IR microscope and GC/IR interface5 Liquid Sample Accessories:5.1 For liquid and powder sample analysis5.2 ATR crystal sample holder is easy to operate and change5.3 ZnSe, Ge and KRS-5 ATR crystals are available for choice6 IR Microscope:6.1 Micro samples analysis, minimum sample size: 100μm (DTGS detector) and 20μm (MCT detector)6.2 Non-destructive sample analysis6.3 Translucent sample analysis6.4 Two measurement methods: transmission and reflection6.5 Easy sample preparation7 Diffuse/Specular Reflectance Accessory:It is a versatile diffuse reflectance and specular reflectance accessory. Diffuse reflection mode is used for transparent and powder sample analysis. Specular reflection mode is for measuring smooth reflective surface and coating surface.7.1 High light throughput7.2 Easy operation, no internal adjustment needed7.3 Optical aberration compensation7.4 Small light spot, able to measure micro samples7.5 Variable angle of incidence7.6 Fast change of powder cup8 Horizontal ATR(Single-reflection and Multi-reflection)/Variable Angle ATR(30°-60°)Horizontal ATR is suitable for the analysis of rubber, viscous liqui, large surface sample and pliable solids etc. Variable angle ATR is used for measurement of films, painting (coating) layers and gels etc.8.1 Easy installation and operation8.2 High light throughput8.3 Variable depth of IR penetration9 Accessory for Determination of Hydroxyl in IR Quartz9.1 Fast, convenient and accurate measurement of Hydroxyl content in IR quartz9.2 Direct measurement to IR quartz tube, no need to cut samples9.3 Accuracy: ≤1×10-6 (≤1ppm)10 Accessory for Oxygen and Carbon in Silicon Crystal Determination10.1 Special silicon plate holder10.2 Automatic, fast and accurate measurement of oxygen and carbon in silicon crystal10.3 Lower detection limit: 1.0×10-6cm-3 (at room temperature)10.4 Silicon plate thickness:0.1-3.5nm11 SiO2 Powder Dust Monitoring Accessory11.1 Special SiO2 powder dust monitoring software11.2 Fast and accurate measurement of SiO2 powder dust12 Component Testing Accessory12.1 Fast accurate measurement of the response of such components as MCT, InSb and PbS etc.12.2 Curve, peak wavelength, stop wavelength and D* etc can be presented13Optic Fiber testing Accessory13.1 Easy and accurate measurement of the loss rate of IR optic fiber, overcoming the difficulties for fiber testing , since they are very thin, with very small light-passing holes and uneasy to fix14 Jewelry Inspection Accessory14.1 Accurate identification of jewelriesSpecifications Spectral Range:7800 to400cm-1Resolution:Better than 0.85cm-1(WQF510), Better than 0.5cm-1(WQF520)Wavenumber Precision:±0.01cm-1Scanning speed:0.2-2.5cm-1/s, automatically optimized for detector type or manually adjustable for specific applicationsSignal to Noise Ratio:Better than 15000:1 (RMS value, at 2100cm-1- 2000cm-1 or 2100cm-1- 2200cm-1, resolution: 4cm-1, detector: DTGS, 32times date collection)Beam Splitter:Ge coated KBrInfrared Source:External, air-cooled, high efficiency Reflex Sphere moduleDetector:DTGS, MCT (optional)Date System:Compatible computerSoftware:FT-IR software contains all routines needed for basic spectrometer of operationsIR Library:11 IR libraries includingDimensions:63×52×24cmPower:AC:220V/50HZ, 1000VAWeight:20kg