SPM8800 Rastersondenmikroskope

Features STM (Scanning Tunneling Microscope) 2 AFM (Atomic Force Microscope) Oscillating and Contact Mode Automatic Approach and Retreat function to avoid damaging sample/tip True 3D graphics processing Depth and Width of Calibration Function Automatic identification of the different scanners CCD to assist in aligning laser to probe With dual-display, real-time adjustment and control parameters image display screen WINDOWS VISTA, XP compatibility for SPM Controller and Post-Processing software Technical Parameters:Resolution Horizontal: 0.1 nm vertical: 0.01 nm Scan range 20µm X 20µm Scanning Platform Size 20 nm x 20 nm Scanning Frequency 0.1Hz —100Hz Scan Rotation 0 — 360° D / A precision 16bit A / D precision 16bit,16-channel Bias voltage 0 —10V Tunneling Current Preferences 0.1nA —10nA Image resolution 512X512,1024X1024 Color Quality True Color