EWG / SMART-2005 intelligente ET / MMT / UT Tester

EEC/SMART-2005 intelligent ET /MMMT/UT tester is a new generation of NDT instrument with powerful functions, leading technique and good expansibility. With advanced technologies and functions, such as array eddy current testing ability, multi-channel testing functions of magnetic memory and magnetic flux leakage, 80M high-speed sampling UT function use 12bit A/D, DSP digital processing technique, SMT process technology, EEC/SMART-2005 is multi-functional tester which can be applied in various industries. The equipment is supply power by new-type lithium battery, and the users can select display of TFT true-color or electroluminescent high-light. EEC/SMART-2005 has industrial computer modular organization with stable performance and high reliability. The equipment can supply strong computational capability, display of large screen and high resolution, and storage space of large testing data. Main parameters and technical feature Magnetic memory detecting Measurable channel: 8 channels Minimum measurable distance: 1mm Maximum measurable distance: 150mm Maximum scanning speed: 0.5m / Second Eddy current/remote-field detection 2 frequency and 4 channel (Extendable to 8 frequencies) frequency range: 64Hz-5MHz (Remote field:5Hz 5KHz) Gain: 0-90dB,step length: 0.5 dB Automatically/manually measure amplitude and phase Non-equal phase/amplitude alarming Array eddy current testing function and C-scan function Impedance plane and stripe curve displays Online operation, prompt with hotkey help Parameter, graphic data can be transferred between the same type equipment or with microcomputerMagnetic Flux Leakage /low frequency electromagnetic detecting Channels: 8 Gain: 0-90dB,with step length of 0.5 dB High-pass wave: 0 1999. 9Hz Low-pass wave: 0.1 Hz 2 KHzUltrasonic detecting Range of working frequency: 0.5M 20M Adjust gain: 0-120dB with step length of 0.5 dB, Hairbreadth: -1dB 3dB Demodulation way: positive/ negative, bi-direction and RF Sampling precision: 12 bit AD Sampling velocity: 80MHZ Pulse shift: -101000m/s (steel longitudinal wave) Zero point of probe: 0200μS Sound velocity of Material: 100015000m/s Testing range: 010000mm (steel longitudinal wave) Continue-adjustable, minimum display range : 1.0mm Suppress: -80% linear restrain Error of vertical linearity: ≤3 Surplus sensitivity: ≥ 53dB DAC/TDG curve Measuring resolution: 0.03mm Memory date: 1000 groups, 100 groups of parameters Others technical standardMicroprocessor: 16 bits Memorizer: 128M (Extendible to 2G) Internal memory capacity: 16M TFT color screen/ High-light EL screen: EL 320x240 Operating temperature: -2560 Internal power supply: 14.4V 4AH(rechargeable lithium battery) External power supply: AC 220V Graphics and parameter can be stored, replayed and analyzed