出生地 |
Jiangsu China (Mainland) |
牌子的名字 |
Tonghui |
模式的数量 |
TH2828S |
TH2828S Precision LCRmeteris 1 new-generation impedance measurement instruments applying the advanced technique of auto balance bridge in the world .It can be used for all component and material’s measurement needs with a basic accuracy (0.05%), wide frequency range of 20Hz to MHz and impedance range up to 100MΩ. It can be more useful for measurement of capacitance with low ESR and inductor with high quality factor (Q). The high power measurement condition with AC measurement signal of 20V, DC bias of 40V and list sweep function make it easy to extend user’s capability of valuing component. Four-terminal pair terminal configuration helps eliminate electromagnetic coupling effect of test cable, which extends the low limit of measuring low impedance ten times as other instruments which use normal five-terminal configuration. TH2828S has frequency response function, analysis function of AC signal voltage/current and DC bias voltage/current. It can be used to analyze electronic characteristics of microphone, resonator, inductor, ceramic capacitor, LCD display, and transformer. TH2828S LCR meter is a puissant tool for component design, inspection, quality control and measurement on production line. Its excellent performance and powerful functions make it easy to design electronic circuit and research materials (electronic material or non-electronic material). TH2828S matches commercial and military standard, for example IEC and MIL with its excellent performance. Various Measurement Device Passive Component: Impedance measuring of capacitor, inductor, magnetic core, resistor, transformer, chip module, network component, etc. Semiconductor: Varactor C-V characteristics, parasitic of transistor and IC. Others: Impedance evaluation of PCB, relay, switch, cable, battery, etc. Dielectric Material: Permittivity and dissipation of plastic, ceramic, etc. Magnetic Material: Permeability and dissipation of ferrite, non-crystal material. Semiconductor Material: Permittivity, conductivity and C-V characteristics of semiconductor material. LCD Material: Permittivity, elasticity and C-V characteristics of LCD cell. Versatile component and material measurements ability Finding manifold characteristic of inductor TH2828S can accurately analyze performance of inductor/magnetic material with wide measurement frequency (20Hz--1MHz) and excellent performance. By using optional TH10301 (100mA DC bias source), the meter can accurately measure low DC bias current performance of high-frequency inductor, communication transformer and filter. By using TH1775 DC Bias Current Source, DC bias can reach 40A for analyzing inductor with high power and current. Accurately measurement for ceramic capacitor 1kHz and 1MHz are primary measurement frequencies for ceramic material and capacitor. Low dissipation factors are essential for ceramic capacitor. The C & D can change as a function of the applied measurement signal level to the DUT. With wide impedance measurement range, 6-digit resolution and automatic level control function (ALC), the meter can match accurate and reliable measurement needs for ceramic capacitor. Capacitance characteristic measurement for LCD cell Voltage-capability(C-VAC) characteristic is the primary method for evaluating performance of LCD material. The problem of general instrument’s measurement for C-VAC characteristic of LCD cell is that the maximal measurement voltage is not enough. The optional TH10301 can offer programmable measurement signal voltage up to 20Vrms with resolution of 1%, which makes it easy to measure capacitance of LCD material with the best condition and high efficiency. Measurement for semiconductor material and component The major performance of MOSFET is oxide-layer capacitance (Cox) and density of impurity in semiconductor. All of these can be calculated from measurement of C-VDC. With wide measurement frequency (20Hz to 1MHz) and programmable DC bias source of 40V, the meter can easily perform the measurement of C-VDC. The extended cable and probe is needed to measure semiconductor component on silicon-wafer. 2m/4m extended cable can reduce error of cable extension. The meter can measure distributed capacitance of diode, transistor and MOS. Adaptable measurement needs on various fields R&D of new materials and component TH2828S greatly increases the reliability of measurement with basic accuracy of 0.05%. The instrument can identify the slight change of component with its 6-digit resolution, especially measuring low-dissipation capacitor. Improvement of production line efficiency The high speed (30ms/time) can greatly increase test throughput, to improve production efficiency a lot. Built-in comparator, cable length compensation and HANDLE interface help build an automatic component measurement system. The internal non-volatile memory and USB disk can reduce operation time and errors. Various applications for quality control and assurance With wide measurement frequency (20Hz--1MHz) and wide measurement signal level range (5mVrms--20Vrms) can satisfy measurement need of most components. TH10301 and TH1775 solve the problem of DC bias source. The meter also has accessories of various test fixtures, including axial, radial and SMD component test fixture. User's friendly interface Simple operation of front panel All control setting, softkeys, monitor information are directly displayed on the 320x240 dot-matrix large LCD. This display mode helps to simplify key operation and enhance test efficiency. Non-volatile memory to save measurement settings TH2828S provides internal non-volatile memory which can save 20 sets of measurement setting files. The USB disk that TH2828S has can save and recall instrument setting. It minimizes greatly setup errors and operation time. Flexible data communication mode TH2828S meter provides GPIB interface which makes it possible to build an automatic component measurement system and communicate with each other. On the other hand, RS232 interface with low cost makes it convenient to communicate with computer. Powerful function of analyzing component TH2828S has the function of curve analysis which can analyze component’s characteristics. For example resonance analysis of component, bias current of ceramic component, bias voltage of capacitive diode, and AC voltage of LCD material. Special analysis software can be provided to get more characteristics component concerns about, and improve measurement efficiency. TH2828S measures conductance/phase and conductance/susceptance characteristics through GPIB or RS232C.