СМК измерительный микроскоп

Stand Granite Base Digital image and advanced data processing software . Large strage(up to 400×200)and high precision Erect image trinocular (the image in the field of view has the same orientation as the specimen) Non-contact depth measuring system cooperate with the data system Easy remove from low magnifications to high magnifications Various options of illuminator Built-in crosshair reticle type Ergonomics Measuring system 5 types of stage for options with the accuracy at 3+L/50μm (L=measurement length); and minimum messuring unit of 1 μm by ACU-RITE scale. Stand Granite Base (650×440×80mm,450×400×80mm). SQM with Z-axis measuring scale offers various digimatic and Linear Gage for options. Resolution vary from 1μm to 0.1μm in terms of the attached optional accessories. Applications Semiconductor encapsulation Measurement of height of IC probe, bonding wire,lead frame and etc. MEMS HDD arm SMT Tools/Wafer Level CSP/Punching Components/Molds Recent Application (Probe Card)