Металлургический микроскоп QJX-4600

Specification Viewing Head Compensation Free Trinocular Head,Inclined30°(50mm-75mm) Eyepiece WF10×/25mm WF×/20mm,crosshair with reticule 0.1mm Nosepiece Quintuple Nosepiece with DIC Jack Objective Long working distance bright and dark field Infinite Plan objectives:5×/0.1B.D/W.D.29.4mm 10×/0.25B.D/W.D16mm 20×/0.40B.D./W.D.10.6mm 40×/0.60B.D./W.D.5.4mm Stage Double layer mechanical stage Stage Size:189mm×160mm Moving Range:80mm×50mm Filter Flashboard type filters(grreen,blue,neutral) Condenser N.A.1.25 Abbe condenser with iris diaphragm and filter Focusing Coaxial coarse&fine focuing adjustment with rack and pinion mechanism Fine focusing scale value 0.002mm Light Source Epi-illumination:With aperture iris diaphragm and field iris Diaphragm,Halogen Bulb 12V/50W,AC85V-230V,Brightness Adjustable Polarizing Device Analyzer rotatable 360°,Polariaer&Analyzer can be moved in/out of the optical path Checking Tool 0.01mm Micrometer Optional Accessory Two-dimensional measurement software Professional metallurgical image analysis software Epi-illumination: Halogen Bulb 12V/100W,AC85V-230V,Brightness Adjustable Long working distance bright and dark field Infinite Plan objectives:50×/0.55B.D/W.D5.1mm, 80×/0.75B.D/W.D.4mm, 100×/0.80B.D/W.D.3mm Micrometer eyepiece 1.3Mega,2.0 Mega,3.0Mega,5.0Mega,pixels CMOS Digital camera eyepieces Eyepiece:WF15×/17mm, WF20×/12.5mm Photography attachment and CCD Adapter 0.5X,0.57X,0.75X DIC(10X,20X,40X,100X) Planish tool CCD Camera,colour1/3″ High resolution 520TV lines Characteristics and description Adopt UIS High-resolution, Long working distance,and infinity light path correcting system objective imaging technologyExtending the multioplexing technology of objective,compatible infinity objective with all the observation methods.including bright & dark field observation,polarization and DIC also provide with high clear and sharp image in each in each observation methodAspherical surface Kohler illumination,increasing the viewing brightnessWF10×(Φ25)super wide Eyepiece, long working distance metallurgical objective with bright and dark fieldThe Nosepiece can be equipped with detachable DIC differential interference device.